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Image description: Science can be art. A National Institute of Standards and Technology (NIST) calibration system used infrared laser light to precisely measure the thickness of 300 millimeter silicon wafer.
Photo by Q. Wang, U. Griesmann/NIST
Find more science as art images on Flickr.

Image description: Science can be art. A National Institute of Standards and Technology (NIST) calibration system used infrared laser light to precisely measure the thickness of 300 millimeter silicon wafer.

Photo by Q. Wang, U. Griesmann/NIST

Find more science as art images on Flickr.